T85.01XA | Breakdown (mechanical) of ventricular intracranial (communicating) shunt, initial encounter |
T85.01XD | Breakdown (mechanical) of ventricular intracranial (communicating) shunt, subsequent encounter |
T85.01XS | Breakdown (mechanical) of ventricular intracranial (communicating) shunt, sequela |
T85.02XA | Displacement of ventricular intracranial (communicating) shunt, initial encounter |
T85.02XD | Displacement of ventricular intracranial (communicating) shunt, subsequent encounter |
T85.02XS | Displacement of ventricular intracranial (communicating) shunt, sequela |
T85.03XA | Leakage of ventricular intracranial (communicating) shunt, initial encounter |
T85.03XD | Leakage of ventricular intracranial (communicating) shunt, subsequent encounter |
T85.03XS | Leakage of ventricular intracranial (communicating) shunt, sequela |
T85.09XA | Other mechanical complication of ventricular intracranial (communicating) shunt, initial encounter |
T85.09XD | Other mechanical complication of ventricular intracranial (communicating) shunt, subsequent encounter |
T85.09XS | Other mechanical complication of ventricular intracranial (communicating) shunt, sequela |
T85.110A | Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), initial encounter |
T85.110D | Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), subsequent encounter |
T85.110S | Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), sequela |
T85.111A | Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), initial encounter |
T85.111D | Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), subsequent encounter |
T85.111S | Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), sequela |
T85.112A | Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead), initial encounter |
T85.112D | Breakdown (mechanical) of implanted electronic neurostimulator of spinal cord electrode (lead), subsequent encounter |